This article is trying to make sense out of confusing information regarding
the behavior of a MOSFET during switching sequences, in numerous technical articles.
We are not attempting to explain
the physics behind a MOSFET structure. For those interested to find more about a MOSFET structure, we
recommend the SGS-Thomson technical articles mentioned in the references. The purpose of the article is to present
a power supply design engineer with facts that will help design a MOSFET driving circuit, calculate the estimated
losses for critical events, predict the efficiency of a power supply, estimate the junction temperature for
critical components and various stresses, and ultimately, helping make decision to optimize a design.
The MOSFET switching events are analyzed for an inductive load, diode
clamping circuit, the only one that applies to a switching power supply. The datasheet information or
technical articles regarding resistive loads have little or no relevance to switching a MOSFET in a switch mode
power supply. Also the article is considering only 500V/600V MOSFETs, most relevant and for switch mode power supplies.
Capacitors reference designators are the same as in SGS-Thomson articles.
Check the references if a more detailed explanation of their significance is necessary.
Below are the waveforms, mostly self-explanatory related with a MOSFET switching
on (inductive load, diode clamping, hard switching):
And now the comments:
- Gate voltage has a sharp
rise at t1 due mainly to the MOSFET source inductance.
- Internal MOSFET channel
will carry also the Coss discharge current.
- At t3 the drain voltage
will reach Vx, usually around 25V for 500V MOSFETS. After
this time Vds*Idrain loss should be considered part of
the conduction loss.
- Q3, gate charge associated
with drain voltage reaching Vx, is much smaller then Q3+Q4,
commonly specified in a MOSFET datasheet.
Common errors and
misconceptions:
- Error: Drain voltage will decreased
linearly to zero during t2 - t4 period, when gate voltage
is constant (gate plateau voltage).
- Reality: Drain voltage will decrease much
faster reaching Vx voltage, during t1 - t2 period.
Calculating the switching loss associated with this
period of time, considering that the drain voltage will
decrease linearly for the entire "plateau"
period, will results in huge errors.
- Error: Drain voltage will reach zero at
t2b (the end of the diode reverse recovery period).
- Reality: Drain voltage will decrease much
faster reaching Vx voltage, during t1 - t2 period.
Calculating the switching loss associated with this
period of time, considering that the drain voltage will
decrease linearly for the entire "plateau"
period, will results in huge errors.
- Error: MOSFET capacitances cannot be
used to determine switching behavior, you need gate
charges values.
- Reality: MOSFET capacitances, if fully
characterized, can fully explain (together with other
parameters) the switching behavior, without the need for
gate charges.
- Error: MOSFET datasheets give enough
information to characterize the switching behavior of a
MOSFET in your application.
- Reality: Most MOSFET datasheets,
for reasons not discussed in this article, are not
giving enough information to be able determine the
switching behavior in a typical application for which the
part was intended to be used. Time characteristics (turn-on
delay time, rise time, turn-off delay time, fall time)
are measured in conditions that bear no resemblance
with a typical application of the device, so, the
best for a design engineer would be to disregard them
altogether. An attempt to use them to "guestimate"
the real useful data, it is time consuming and usually
not done by engineers.
- A notable exception:
Motorola datasheets, similar with the one mention in the
references for MTW20N50E, are providing the information
that really matters in determining the switching
behavior. To the best of our knowledge, current at the
time this article was last updated, Motorola
datasheets were the only ones providing all following
critically needed characteristics: Vx voltage, gate
charge needed for drain voltage to drop from Vdd to Vx,
high voltage capacitance variation in a readable chart,
low voltage capacitance variation in a readable chart,
Ciss and Crss variation at low voltage, zero Vgs and
Vds, zero Vds and Vgs zero to 10V, internal source
inductance.
Other Considerations:
- SMPS Power Supplies is
using the above described correct theory regarding MOSFET
switching to accurately calculate the switching losses in
PFC hard switching and soft switching topologies.
Combined with our accurate models for diodes (with
voltage drop, reverse recovery time and reverse recovery
current being functions of operating temperature, forward
current, dI/dt), the design spreadsheets (ADH2450Des__.xls,
ADH8100Des__.xls) are the most accurate design tools for
designing and predicting the performances of a switching
power supply.
References:
- Study of a Model for Power
MOSFET Gate-Charge, SGS-Thomson Microelectronics, Power
MOS Devices Data book, 1st Edition - June 1988.
- Gate Charge Characteristics
Lead to Easy Drive Design for Power MOSFET Circuits, by M.
Melito and F. Portuese, SGS-Thomson Microelectronics,
Designers' Guide to Power Products, Application Manual, 2nd
Edition - June 1993.
- MTW20N50E, Designer's Data
Sheet, Motorola - REV 4, 1996.
-
- SMPS
Intellectual Property
- This article contains information for
which SMPS Power Supplies and its partners may claim
Copyright and/or Trademark rights and may be subject of a
Patent application. Also SMPS Power Supplies and its
partners may claim the status of "First to be
published", relative to ideas published in this
article. Any third parties may quote reasonable parts of
this article without contacting us, assuming that the
source is clearly identified and a link to the full
article is included. If you wish to incorporate
information from this article within a commercial
product, you should contact us for permission.
- First LCD Consulting
internal document: 19 Oct 1991
- Major update, SMPS Power
Supplies internal document: 10 Feb 1998
- Web first published: 3 Aug
2002
- Last Revision: 3 Sep 2005
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